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-"Anything that can go wrong - Will"-Murphy

What is my next step to be performed?

Now Lets start with an assumption that anything may go wrong

What are the various areas can things go wrong?

  • List down the areas in the flow that things can go wrong and derive a methodology to verify at each and every stage.
  • List down all your uncertainities that could potentially happen and how to model it and how to constrain and verify up-front.

Lets Explore and re-visit each and every area in the Design flow to cover potential risk

  • Functional Verification (RTL level , Gate level)
  • Formal Verification
  • Static Timing Analysis
  • Physical Verification
  • Power Simulation
  • Thermal Simulation
  • Noise Simulation
  • Test Simulation
  • Emulation
  • Hardware proto-type
  • Hardware Software co-simulation
  • Transistor level Simulation

Now lets Venture in to each area and insure it

Functional Verification:

  • TLM(Transaction Level Modelling)
  • Linting
  • RTL Simulation ( Enivronment involving : stimulus generators, monitors, response checkers, transactors)
  • Gate level Simulation
  • Mixed-signal simulations
  • Regression

How Much Did I cover in the functional part - What is my Coverage Metric? and what are the methodologies used?

  • Is the verification tests covered pin-pointed tests or tests with random seeds to cover all the corner-cases.
  • Code-coverage
  • Line coverage
  • Functional coverage

Formal Verification:

  • Equivalence checkers
  • RTL versus Gate
  • Pre-layout versus post-layout Netlist
    • Assertion based property checkers(Mathematical techniques to allow larger state space coverage)

    Timing Verification:

    • With whom the Chip is talking to (To know the Interface Timing's)
    • What is the Timing-budgets with in the chip, and how to constrain it within each I.P. and finally analysing and sigining for Timing-targets
    • How to address the timing targets with varying process parameters(on-chip variation) what is the optimal derating number to be set so that variations are addressed.
    • Steps to minimize the clock-jitter.

    Physical Verification:

    Is my design process friendly ?

    • DRC (Design Rule Check)
    • LVS
    • Antenna Checks
    • ERC
    • ESD checks
    • Speed monitor's

    Noise Simulation:

    How Noisy is my design so need to perform noise simulations addressing these areas

    • Simultaneous Switching Noise (SSN)
    • Package Noise
    • EMI Noise
    • Power-ground noise
    • Cross-talk noise
    • Analog Noise
    • Substrate noise

    Power Simulations:

    Is my design meeting power-targets

    • IR drop analysis
    • Dynamic power simulations

    Power related methodologies

  • Optimum location for De-caps
  • Multiple Voltage domains
  • Multi Vt design
  • DVFS (Dynamic Voltage and Frequency scaling)
  • Clock-gating Techniques
  • Power Management Unit (to shut-off when not required)
  • Level-Shifters across cross-voltage domains
  • Thermal Simulations

    Study the thermal targets and mechanism to reduce

    Test Simulations

    Is my design testable once chip comes out, methodologies to identify the problematic areas

    • Boundary Scan
    • Memory BIST simulations
    • Tester specific vector generation and simulations
    • Tester vector compression techniques to reduce tester time
    • At-speed testing mechanism's
    • Scan-shift and scan-capture methodologies
    • IDDQ testing
    • Wafer Level Burn-in Tests to know Known Good Dies(KGD)
    • Wire pull tests
    • DC parameter tests
    • AC parameter tests
    • Path-delay tests
    • Delay tests
    • Transition fault testing

    Addressing DSM and Yield Issues

    • Redundant via's
    • Spacing non critical areas to be lithography friendly
    • Wire widening
    • Metal Filling
    • Metal Slotting

    Emulation:

    Emulates the functional behaviour of the design. Synthesizable assertions are mapped to emulators to perform at system speeds.

    Hardware prototype:

    Proto-typing the system requirements in a programmble FPGA's

    Inspite of all the Verification Methodologies and Strategies if things goes wrong, how to address that in the design - Methodologies to reduce cost & time

    • Spare-gates
    • Redundant rows/columns in the memories
    • Redundant vias
    • Built-in self repair memories
    • Focussed Ion Beam Methodologies

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